Modal analysis of linear Talbot-cavity semiconductor lasers

A modal analysis at threshold is presented for linear Talbot-cavity semiconductor lasers with a finite number of array elements. The analysis self-consistently calculates the array supermode profiles and the loss each incurs owing to imperfect Talbot imaging, including edge diffraction losses. It is found that the decrease in mode discrimination between supermodes incurred by fabricating larger arrays can be offset by reducing the near-field fill factor.