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Mass spectra of positive ions emitted from polycrystalline metallic targets (Al, Mn, Co, Ta) were analyzed by the mass spectrometric method when the targets were bombarded by the analyzed Ar+ ion beam of 40-keV energy. Single- and multiple-charged atomic components, as well as single-charged molecular components, were detected. The energy distribution curves for some mass-spectra components, measured by the retarding potential method, are presented.
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Jurela et al. (1968) studied this question.
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