Pulse drive currents were utilized to investigate dc current-induced rollover of illumination efficiency of GaN-based power light-emitting diodes (LEDs). By using the pulse drive currents, we can separate the effects that junction temperature and current injection have on dc current-induced rollover of illumination efficiency of GaN-based power LEDs. Comparing the measurement results obtained from pulse and dc drive currents, we verified that junction temperature and current injection were the major causes of dc current-induced rollover of illumination efficiency of power LEDs.
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Michael P. Liao (2007) studied this question.
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