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September 29, 2006IEEE Transactions on Electron Devices

Integrated micro-Raman/infrared thermography probe for monitoring of self-heating in AlGaN/GaN transistor structures

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Authors

ASAndrei SaruaHJHangfeng JiMKMartin Kuball

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Sarua et al. (2006) studied this question.

synapsesocial.com/papers/6a85bfa74f2eb4dbc91e6d69https://doi.org/10.1109/ted.2006.882274
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