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July 1, 1976Journal of Applied Physics

An Auger analysis of the SiO2-Si interface

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Authors

JJJ. S. JohannessenOslo University HospitalWSW. E. SpicerStanford Synchrotron Radiation LightsourceYSY. E. StrausserSanta Barbara City College

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Johannessen et al. (1976) studied this question.

synapsesocial.com/papers/6a85c09d37bcb8373dadbabchttps://doi.org/10.1063/1.323047
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  1. 1The Si-SiO<sub>2</sub>Interface - Electrical Properties as Determined by the Metal-Insulator-Silicon Conductance Technique1967 · 1,851 citations
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  5. 5Wetting of thin layers of SiO2 by water1974 · 185 citations