The characterization of particles, especially aerosol particles, is of great importance to many scientific fields. A relevant brief overview is given. A rigorous scheme of sampling and in-depth characterization of particulate samples has been developed in the authors’ laboratories and by collaborative groups, including investigations by the following techniques: total reflection X-ray fluorescence spectrometry for quantitative bulk characterization; solid-state speciation by valence band X-ray spectrometry using electron microprobe or Mössbauer spectrometry (only bulk particle characterization possible); scanning electron microscopy and electron probe microanalysis for automatic semiquantitative single particle characterization of particles ≥0.5 µm; transmission electron microscopy for semiquantitative single particle characterization of particles with diameters down to 10 nm; high resolution-scanning electron microscopy, which is also capable of characterizing particles morphologically and qualitatively down to 10 nm in diameter; secondary ion mass spectrometry for the study of trace elemental distributions and isotopic ratios in particles with diameters above 1 µm. It is the aim of this paper to show the advantages and characteristics of this scheme of analysis to match today′s requirements for topochemical methods of analysis. For this purpose a short overview of these methods for particle characterization is also presented.
No takes yet. Share an insight, caveat, or question.
Ortner et al. (1998) studied this question.
Synapse has enriched one closely related paper. Consider it for comparative context: