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Dependence of intense ion beam divergence on local electron density in diode, difference of the divergence between protons and carbon ions and time varying self-focusing effect were investigated. Experiments were preformed on a Reiden IV generator, loading pinched e-beam ion diode or pinch reflex ion diode. The higher electron current density caused larger beam divergence. According to measured number ratios of carbon to proton, the carbon ions might have smaller divergence than protons. Heavier ions as carbon ions might be suitable for a tighter focus.
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Yoshinouchi et al. (1983) studied this question.
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