Answers are grounded in this paper and cite their sources.
A new diagnostic method capable of measuring beam profiles and trajectories of intense ion beams as a function of time has been developed. The technique employs fast photography in conjunction with fast scintillators. Prior to detection, the excessive intensity of the direct ion beam is reduced by means of Rutherford scattering. A time resolution of a few nanoseconds and a spatial resolution of a few millimeters has been achieved. Using this technique focusing properties of planar and spherical pinch reflex diodes have been investigated. A low energy electron beam precursor has been detected. A simple model for its production is presented.
No takes yet. Share an insight, caveat, or question.
Blaugrund et al. (1982) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: