Influence of the Apparatus Function on Crystallite Size Determinations with Geiger Counter Spectrometers

A brief survey of the various methods used for determining crystallite sizes from x-ray diffraction line broadening is given It is shown that the diffraction profiles determined experimentally with a Geiger counter x-ray spectrometer can be represented by functions of the type y = c /(1+ k 2 x 2 ) 2 Using these functions a correction curve for instrumental influence on line breadth measurements is derived by solving the integral equation B ( x )=integral operator +infinity -infinity b (ν)β( x -ν) d ν by means of the Fourier transform method The apparatus function b ( x ) is determined by using a standard substance Experiments are described which illustrate the effect of sample preparation, absorption, etc. on measurements of line breadth.