The Determination of X-Ray Diffraction Line Widths

The methods which have been suggested for correcting x-ray diffraction line widths for geometrical effects are reviewed. Experimental data are presented for two samples of finely-divided NiO and MgO which show that neither the Warren nor the Jones correction method is valid for these particular specimens. A direct Fourier transform procedure is given which permits calculation of the corrected diffraction line width for all experimental cases.