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January 1, 1972Journal of The Electrochemical SocietyOpen Access

Dielectric Breakdown in Silicon Dioxide Films on Silicon

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COC. M. OsburnNorth Carolina State UniversityDOD. W. OrmondIBM (United States)

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Osburn et al. (1972) studied this question.

synapsesocial.com/papers/6a8680a3bc357473c2a98a7dhttps://doi.org/10.1149/1.2404268
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