A new statistical variability criterion for optimal design and comparative evaluation of thin film RC active filters is proposed. The manufacturing industries should find this criterion to be more realistic and useful in designing and/or deciding on the merits of the filter for large-scale manufacture than any of the multiparameter sensitivity functions suggested so far. Four biquadratic bandpass circuits have been chosen to illustrate the usefulness of the criterion and their optimum variability measure is compared.
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B.A. Shenoi (1974) studied this question.
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