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A microstructure analysis of CoxPt1−x (x=1.0∼0.5) as-sputtered thin films has been performed. The detailed observation by high-resolution transmission electron microscopy (HRTEM) has been performed on films with 20 at%Pt showing the maximum coercivity. The obtained images have been compared with simulated images. The comparison reveales that each crystalline grain in the film has high density of stacking faults of close-packed atomic (CPA) layers. There is a compositional fluctuation in the normal direction of the CPA layer. These results are consistent with the results obtained from X-ray and electron diffraction analysis.
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Ishiguro et al. (1994) studied this question.
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