Source distribution dependent scatter correction for PVI

Source distribution dependent scatter correction methods which incorporate different amounts of information about the source position and material distribution are developed and tested. The techniques use image to projection integral transformation, incorporating varying degrees of information on the distribution of scattering material, or convolution subtraction methods, with some information about the scattering material included in one of the convolution methods. To test the techniques, they are applied to data generated by Monte Carlo simulations which use geometric shapes or a voxelized density map to model the scattering material. Source position and material distribution are found to have some effect on scatter correction. An image to projection method which incorporates a density map produces accurate scatter correction but is computationally expensive. Simpler methods, both image to projection and convolution, can also provide effective scatter correction.>