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Charge-carrier concentrations of well-aligned ZnO nanorods grown on p++-Si substrates are determined by means of ac impedance analysis of devices fabricated directly on as-deposited samples. This approach also demonstrates that the carrier concentration can be controlled by varying the Zn/O source molar ratio (MR) during metal–organic chemical vapor deposition (see figure).
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Wu et al. (2007) studied this question.
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