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A low-energy electron diffraction instrument has been constructed which allows one to visually observe a LEED pattern, record the pattern photographically and obtain immediate, quantitative intensity data from several diffraction beams in 5–10 s. The instrument operates at incident beam currents of a few picoamperes eliminating electron beam damage effects. This paper describes the design and construction of this new LEED instrument and reports on the operating parameters of sensitivity, signal-to-noise, image distortion, and angular resolution.
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Peter C. Stair (1980) studied this question.
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