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February 15, 1968Journal of Applied Physics

X-Ray Stress Topography of Thin Films on Germanium and Silicon

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Authors

GSG. H. SchwuttkeArizona State UniversityJHJ. K. HowardAustralian Nuclear Science and Technology Organisation

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Schwuttke et al. (1968) studied this question.

synapsesocial.com/papers/6a8717cb5ee22a1e35cbab94https://doi.org/10.1063/1.1656399
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