Decreasing slew rates and efforts to reduce the resistance-capacitance (RC) delays of on-chip interconnect through design and technology have resulted in the growing importance of inductance in analyzing interconnect response for timing and noise analysis. In this paper, we consider a practical approach for extracting approximate inductances of on-chip interconnect. This approach, which we call the method of return-limited inductances, is based on performing the inductance modeling of signal lines and power-ground lines independently and on taking advantage of the power and ground distribution of the chip to localize inductive coupling. A set of simple geometry-based matrix decomposition rules guide sparsification in these extractions.
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Shepard et al. (2000) studied this question.
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