Defining the ``Random'' Spectrum as Used in the Channeling Technique of Nuclear Backscattering

A new method is described for operationally defining a ``random'' spectrum as used in channeling studies of nuclear backscattering. The method is reproducible to 1%. A detailed analysis is made for the case of He4 ions backscattered from silicon crystals. Corrections are determined so the ``random'' spectrum approximates that from an amorphous layer to within ± 1%.