Three‐dimensional finite element analysis of N‐port waveguide junctions using edge‐elements

The finite element method is formulated in such a way that the electromagnetic solution of an excited cavity formed from an N‐port waveguides junction leads directly and naturally to circuit characteristics of this junction. The use of edge‐elements eliminates nonphysical solutions. The reliability of the method is assured compared to a penalty method. Accuracy of the method is demonstrated through the presentation of results for a waveguide T‐junction, while its efficiency is proven through the presentation of results for two case studies of a finite step discontinuity and a finline T‐junction.