A one-to-one correspondence between deformation-produced dark spots in cathodoluminescence (CL) micrographs and dislocations has been demonstrated in n-type CdTe by comparing the CL pattern with the etch-pit pattern developed with a new etchant which has been ascertained to reveal dislocations by a successive polishing and etching method.
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Nakagawa et al. (1979) studied this question.
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