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January 6, 1975Physical Review Letters

Substrate Bias Effects on Electron Mobility in Silicon Inversion Layers at Low Temperatures

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AFA. B. FowlerIBM Research - Thomas J. Watson Research Center

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A. B. Fowler (1975) studied this question.

synapsesocial.com/papers/6a87a5cfcc0e5f225b975274https://doi.org/10.1103/physrevlett.34.15
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