In this paper, a new method for simultaneously measuring the complex permittivity, complex permeability and complex chirality parameter of chiral materials in free space is presented. One has to measure the rotation angle, the axial ratio and the complex reflection coefficients of short-circuit (sample is backed with metal) and open-circuit (sample is not backed with metal) samples. Here, this method is named the free space short-circuit and open-circuit method.
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Sun et al. (1998) studied this question.
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