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The Auger electron yield from xenon has been measured in the vicinity of the 4d inner-shell ionization threshold. Just above this ionization threshold the Auger line profile is modified by the post-collision interaction effect involving a slow photoelectron. The process is followed through threshold into a region where the photoelectron is recaptured and either shaken up/down or remains in its Rydberg orbital during the Auger decay. By measuring the electron yield as a function of both incident photon energy and electron kinetic energy a comprehensive study of these processes is made.
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Cubric et al. (1993) studied this question.
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