Several x-ray-absorption K thresholds have been measured for thin-film specimens in helium gas. The data are analyzed in terms of the different types of electrons that are ejected out of atomic cores in x-ray-absorption events and their relative contribution to the output signal. Theoretical expressions are derived that predict the K-edge yield as a function of the thickness, density, and atomic concentration of the specimen and as a function of the K-edge nature. Fits yield values of the coefficients in these expressions for samples irradiated with x rays with energy in the 5--10-keV range.
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Girardeau et al. (1992) studied this question.
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