EXAFS in photoelectron yield spectra at K edges of Cu, Ni, and Ge

The total photoelectron yield as function of the photon energy of poly and single crystal Ni and Ge and of thin films of Cu on Ni are measured at the K absorption edges and compared with the absorption coeffiecient. The data are discussed concerning the relative contribution of electron cascades caused by Auger and photoelectrons to the yield and the information depth of the yield EXAFS method.