Charge trapping in thin dielectric films on metal substrates is investigated by thermally and optically stimulated exoelectron emission. The techniques are used to detect hot-electron-induced chemical degradation of hydrocarbon films. Radiation-induced electron traps are found if the films are irradiated with hot electrons above a threshold energy of 3.5 to 4 eV.
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Cartier et al. (1987) studied this question.
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