Electronic densities of states from x-ray photoelectron spectroscopy

In x-ray photoe lectro n spectrosco py (XPS), a sample is exposed to low energy x rays (a pp rox im ately keY), and th e res ultant photoelectrons a re analyzed with hi gh precis ion for kin eti c energy. Aft er co rrection for in e las ti c scatt erin g, th e measured ph otoe lectron spectrum s hould refl ect th e va le nce ba nd density of states , as we ll a s the binding ene rgies of se ve ra l co re e lec tro ni c le vels. All features in thi s spectrum will be modul ated by a pprop ri ate photoelec tri c c ross sec ti ons, a nd th ere are several types of final -s tate effects whi c h could co mpli cate th e interpretation furth er.