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We report the results of transport measurements on epitaxial Cr thin films. The variation of TN (The Néel transition temperature) with respect to the film thickness is discussed in terms of the stress in the film. In addition, the temperature dependence of the magnetoresistance and Hall resistance for temperatures from 4 to 150 K are measured and discussed, with particular attention to the temperature dependence of the nonlinear portion of the Hall data.
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Mattson et al. (1990) studied this question.
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