The author introduces an algorithm for the reconstruction of the tip-sample interactions in amplitude modulation atomic force microscopy (“tapping mode”). The method is based on the recording of amplitude and phase versus distance curves and allows the reconstruction of tip-sample force and energy dissipation as a function of the actual tip-sample distance. The proposed algorithm is verified by a numerical simulation and applied to a silicon sample in ambient conditions.
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H. Hölscher (2006) studied this question.
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