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We performed X-ray photon correlation spectroscopy (XPCS) of rubber containing filler during vulcanization. Using XPCS, we successfully measured the change in the scattering intensity fluctuation, that is, the structural fluctuation of filler in rubber during vulcanization. XPCS also revealed the change in intensity fluctuation with sample temperature. Thus, XPCS is shown to be a promising tool for investigating the dynamics of filler in rubber, which is a key to understanding the reinforcement of rubber by filler.
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Shinohara et al. (2007) studied this question.
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