A PbTe flux has been used for n-type (Te) doping of GaAs, GaSb, and AlGaSb. The effects of surface accumulation and Te desorption were noticeable in secondary-ion mass spectroscopy profiles of GaAs layers grown at temperatures in excess of 540 °C. Te accumulation was not apparent in GaSb layers grown at temperatures up to 630 °C, but Te desorption occurred from GaSb at temperatures above 540 °C. The donor ionization energy of Te in AlxGa1−xSb is 44 meV for 0.4
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Newstead et al. (1989) studied this question.
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