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December 19, 2011Applied Physics Letters

Transport-mechanism analysis of the reverse leakage current in GaInN light-emitting diodes

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QSQifeng ShanRensselaer Polytechnic InstituteDMDavid S. MeyaardRensselaer Polytechnic InstituteQDQi DaiMicrosoft Research (United Kingdom)

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Shan et al. (2011) studied this question.

synapsesocial.com/papers/6a893da87fec28afabc10efehttps://doi.org/10.1063/1.3668104
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