The method for the observation of ferroelectric domain structure in TGS by means of cleavage is presented. By this method, very clear colored images of domain structure have been obtained by the use of a differential interference microscope. Applying the shadow decoration technique to the replication of the cleavage surface for electron microscopic observation, we could examine extremely fine domain structure just below Tc after heat treatment. The most minute domain delineated by this method was about the size of 20 nm.
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N. Nakatani (1989) studied this question.
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