Answers are grounded in this paper and cite their sources.
We have analyzed the structure of tilted superlattices on atomically stepped surfaces by using atomic force microscopy to detect ridges of GaAs formed by the selective oxidation and removal of intervening AlAs regions. Oxides were removed in a liquid cell of the atomic force microscope while scanning. We have demonstrated plan views which reveal the superlattice length and width uniformity, but the method is also in principle suited for cross-sectional samples.
No takes yet. Share an insight, caveat, or question.
Chalmers et al. (1989) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: