We report a systematic study of the effects of wet chemical treatment, inductively coupled plasma etching, and thermal annealing on the surface and optical properties of Mg-doped p-type GaN. The chemical bonding and surface stoichiometry of the GaN surface subjected to different processing steps are analyzed based on the results of x-ray photoelectron spectroscopy. Atomic force microscopy has been employed to characterize the surface morphology. Photoluminescence (PL) and micro-Raman techniques have been used to investigate the electronic and vibrational properties of plasma etched surface. We have correlated the surface changes induced by dry etching of p-type GaN to the corresponding changes in the defect and impurity related states, through their manifestation in the PL spectra. We have observed several local vibrational modes (LVMs) in p-type GaN subjected to various processing steps. A broad structure in the low-temperature Raman spectra around 865 cm−1 is attributed to the electronic Raman scattering from neutral Mg acceptors. In addition to the LVMs of Mg–Hn complexes, two new modes near 2405 and 2584 cm−1 are observed from the etched p-GaN surface. We have also carried out PL and micro-Raman analyses of Mg-doped GaN films annealed under different conditions.
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Tripathy et al. (2002) studied this question.
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