We investigated leakage characteristics of Pt/(Ba0.5Sr0.5)TiO3(BST)/Pt capacitors by measuring current-voltage characteristics during annealing in vacuum and atmosphere. Built-in electric fields (E i) generated at Pt/BST interfaces are derived from analysis of the leakage currents based on the Schottky conduction mechanism. It was found that E i varies in proportion to the square root of annealing time (√ t). In addition, we found that an external electric field applied during annealing in vacuum induces asymmetric degradation in the leakage characteristics at the top and bottom Pt/BST interfaces. Such behavior in the leakage characteristics is interpreted in terms of the diffusion of oxygen vacancies at the interfaces. Diffusivity of oxygen vacancies is determined from E i-√ t curves.
No takes yet. Share an insight, caveat, or question.
Maruno et al. (2000) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: