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Fabrication of planar optical waveguides by silver-ion exchange in glass, and the resulting refractive index profiles related to the fabrication conditions, are investigated. The second-order polynomial profile model proposed by Stewart et al. [3] is confirmed, and the dependence of the model characteristics on fabrication conditions is analyzed. Use of the resulting relationships is demonstrated by the compilation of a design table of expected waveguide mode structures for given fabrication conditions. Methods of exchanged-ion concentration profile determination are reviewed and a simple method based on sample angle lapping is proposed.
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Griffiths et al. (1981) studied this question.
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