Electrochromic Memory Degradation in WOx–LiClO4/PC Cells

Electrochromic memory degradation in Li y WO x has been investigated. When the external circuit connection has a resistor, which is important for a practical display use, the degradation mechanism has been explained by the capacitor discharge model. This model presents an estimation method for determining capacitance and EMF (electromotive force) for a cell. In the case of an open circuit, it has been proved that the simple diffusion theory could be adopted. Several factors, which improve the electrochromic open-circuit memory, have been considered.