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May 15, 1972Physical review. B, Solid state

Experimental Verification of the Surface Quantization of an n -Type Inversion Layer of Silicon at 300 and 77°K

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JPJ.A. PalsNXP (Netherlands)

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J.A. Pals (1972) studied this question.

synapsesocial.com/papers/6a8979daf8670bac6e3345cahttps://doi.org/10.1103/physrevb.5.4208
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