The diffuse scattering of hard x rays from rough solid surfaces has been measured and described quantitatively in terms of an improved distorted-wave Born approximation. The rough surface is characterized by the rms roughness {σ}, the height-height correlation length {ξ}, and the roughness exponent h. The value for {σ} is in excellent agreement with that deduced from reflectivity. The significance of the parameters {σ}, {ξ}, and h is tested by comparison with the results obtained from scanning force mircoscopy.
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Weber et al. (1992) studied this question.
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