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Dynamic force spectroscopy experiments were conducted with a silicon tip on graphite in ultrahigh vacuum. Spectroscopy curves were acquired in the constant-amplitude as well as in the constant-excitation mode. From both modes we extract quantitative force and energy dissipation curves. We show that the calculated tip–sample interaction curves are independent of the operational mode. This proves that quantitative dynamic force spectroscopy is also possible in the constant-excitation mode.
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Schirmeisen et al. (2005) studied this question.
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