Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
December 1, 1972Journal of Applied Physics

Diffusion measurements in thin films utilizing work function changes: Cr into Au

View Full Paper
Ask AI
Bookmark
Share

Authors

RTR.E. ThomasNorthwestern UniversityGHG.A. HaasUniversity of Notre Dame

Discussion

Loading...

Member takes

Overview

Key Points

Key points are not available for this paper at this time.

Cite This Study

Thomas et al. (1972) studied this question.

synapsesocial.com/papers/6a89b264abe412682d92fb2chttps://doi.org/10.1063/1.1661043
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 4 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Constitution of Binary Alloys1958 · 14,824 citations
  2. 2Interference Effects in the Reflection of Low-Energy Electrons from Thin Films of Au on Ir1970 · 62 citations
  3. 3Thin Film Phenomena1970 · 2,014 citations
  4. 4Diffusion in Thin Film Ti–Au, Ti–Pd, and Ti–Pt Couples1972 · 151 citations