A method for the electron and optical microscopic examination of identical areas

The difficulties involved in attempting to obtain optical and electron micrographs from the same area of a metal surface using the standard dry-stripping technique are outlined. An attachment is described which fits over the objective lens of a bench metallurgical microscope, and enables replica supporting grids to be precisely positioned over a feature of interest in the microstructure. By this method, optical and electron micrographs of the same area of the surface may be readily obtained. The mode of operation is described in detail and the applications of the method are indicated.