A bstract X‐ray diffraction studies have been made of two samples of potash‐silica glass whose composition is 20.9% and 29.1% of K 2 O by weight. A Fourier analysis of the intensity curves indicates a structure similar to that found in soda‐silica glass. Each silicon is tetrahedrally bonded to 4 oxygen ions, with each oxygen bonded either to 1 or 2 silicons. The K + potassium ions are situated in holes in the silicon‐oxygen network with an average of about 10 oxygen neighbors.
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Biscoe et al. (1941) studied this question.
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