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March 1, 1968Science

X-ray Diffraction: New High-Speed Technique Based on X-ray Spectrography

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BGB.C. GiessenBoston University GGGlen E. GordonOak Ridge National Laboratory

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Giessen et al. (1968) studied this question.

synapsesocial.com/papers/6a89ce641fb56efa37d472e4 https://doi.org/10.1126/science.159.3818.973.b

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1Application of High-Resolution Semiconductor Detectors in X-ray Emission Spectrography1966 · 97 citations