Separation of the bulk lifetime and surface recombination velocities in semiconductor wafer by a single laser microwave photoconductance

In this paper, we present a new approach for separating the bulk lifetime and surface recombination velocities via a single laser microwave photoconductance. When a pulsed laser pumps on the probed sample, with the illumination of first the front surface and then the back surface with the same light wavelength, the bulk lifetime and the surface recombination velocities are obtained. Detailed theoretical analysis and preliminary experimental results are shown to demonstrate the applicability of the method.