Structure of Thin Layers of Some F. C. C. Metals Deposited on Oriented Ag, Pd and Ni Films

Some f. c. c. meas–Ni, Cu, Pd, Al, Au, Ag and Pb–were evaporated in vacuo on to oriented Ag, Pd and Ni films and the structure of the films was studied the transmission method of electron diffraction. Some films were composed of intermetallic compounds of deposit and substrate metals. But some films were composed of two layers of deposit and substrate metals. In the latter case, the deposit metals grew in the (001) or (111) oriented over growth on a substrate metal at a temperature higher than an epitaxial temperature. The occurrence of these two kinds of oriented overgrowth depended mainly on the percentage misfits.