Spectroscopic analysis reveals thermal donor photoluminescence spectral changes in annealed multicrystalline silicon, indicating oxygen precipitation dynamics mirroring Czochralski silicon.
To analyze the early stage of oxygen precipitation in n-type multicrytalline Si, the spectral change of photoluminescence (PL) induced by thermal treatment at 450–650 °C was investigated in relation to the changes in excess donor and interstitial oxygen concentrations. We observed the characteristic PL bands in the near-band-edge region and sharp lines in the deep-level region in correspondence with the generation of thermal donors and new donors. The observed PL spectral variation is essentially the same as that in Czochralski-grown Si annealed at 450–650 °C.
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Higuchi et al. (2017) studied this question.
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