A design of a low temperature total electron yield (TEY) detector for XAFS is described. Transmission and TEY XAFS data obtained at 80 K on a Au film, GaAs (100) single crystal (TEY) and powder (transmission) are presented and compared. We find excellent agreement between the data obtained using these two techniques for both Au and GaAs.
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Kemner et al. (1992) studied this question.
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